1:30pm to 4:00pm EST
Wednesday, March 4, 2020
Edaptive Computing Inc., Dayton, Ohio
Presenter: Dr. Navid Asadi, FICS Research / University of Florida
Who can attend: Only open to government agencies
To register email: Amanda Moscrip at email@example.com, include name, affiliation, and name of the organization.
Deadline: Register ASAP- Seating is limited.
Optical debugging techniques are usually developed for fault localization and defect characterization step in failure analysis (FA) process. Photon emission, laser imaging, fault injection, etc. are widely used as optical FA techniques. However, same tools can be used by an adversary to localize and probe on-device assets (e.g., keys). This training will cover the principle of how such attacks work on different chips and possible solutions to protect against such attacks both on circuit and package levels. Training will include lecture as well as pre-recorded videos from real world examples done in FICS Research.