Dr. Navid Asadi, University of Florida
In this presentation we will assess the security vulnerabilities in modern integrated circuits (ICs) against contactless optical probing. The basics and the principle of optical probing physics and its various modalities will be presented first. A case study will be presented then using the PHEMOS-1000 machine in our lab which is equipped with electro optical probing and electro optical frequency mapping modules. We will then outline the requirements for an ultimate solution and present a framework to develop proper countermeasures against such attacks.
Navid Asadi is an assistant professor in the department of electrical and computer engineering at university of Florida. His research is mainly focused on physical inspection of electronics from device to system level. He investigates novel techniques for integrated circuits counterfeit detection/prevention, system and chip level reverse engineering, anti-reverse engineering, invasive and semi-invasive physical attacks, integrity analysis, etc. using advanced inspection methods including but not limited to 3D X-ray microscopy, Optical imaging, scanning electron microscopy (SEM), focused ion beams (FIBs), THz imaging, etc. in combination with image processing and machine learning algorithms to make the inspection process intelligent and independent from human. He has recived several best paper awards and is the co-founder of IEEE-PAINE conference.
Bookings are closed for this event.