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Protecting Intellectual Property Cores Against Piracy – MEST Center

Date(s) - 08/04/2021
12:00 - 13:00
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Speaker: Mohammad Sazadur Rahman (under Mark Tehranipoor)

Abstract: The ever-increasing cost and complexity of cutting-edge manufacturing and test processes have migrated the semiconductor industry towards a globalized business model. With many untrusted entities involved in the supply chain located across the globe, original intellectual property (IP) owners face threats such as IP theft/piracy, tampering, counterfeiting, reverse engineering, and overproduction. Logic locking has emerged as a promising solution to protect integrated circuits (ICs) against supply chain vulnerabilities. It inserts key gates to corrupt circuit functionality for incorrect key inputs. However, the security provided by existing logic locking techniques is often thwarted by Boolean satisfiability (SAT)-based oracle-guided attacks. Criteria for successful SAT attacks on locked circuits include: (i) the circuit under attack is fully combinational, or (ii) the attacker has scan chain access. To address the threat posed by SAT-based attacks, in this training we present dynamically-obfuscated scan chain (DOSC) architecture and illustrate its resiliency against the SAT attacks when inserted into the scan chain of an obfuscated design. We demonstrate, both mathematically and experimentally, that DOSC exponentially increases the resiliency against key extraction by SAT attack and its variants. Our results show that the mathematical estimation of attack complexity correlates to the experimental results with an accuracy of 95% or better. Along with the formal proof, we model DOSC architecture to its equivalent combinational circuit and perform SAT attack to evaluate its resiliency empirically. Our experiments demonstrate that SAT attack on DOSC-inserted benchmark circuits timeout at minimal test time overhead, and while DOSC requires less than 1% area and power overhead. Additionally, to perform the manufacturing test of logic-locked design, we present LL-ATPG, a logic-locking aware test method that applies a set of valet (dummy) keys based on a target test coverage to perform manufacturing test in an untrusted environment. LL-ATPG achieves high test coverage and minimizes test time overhead when testing the logic-locked chip before activation without sharing the unlocking key.

Short bio: Mohammad Sazadur Rahman is currently pursuing his Ph.D. under Dr. Tehranipoor. He got his BS from Bangladesh University of Engineering and Technology. He worked in different fabless semiconductor design companies for 3.5 years. His current project includes Scan Security in Supply chain, ASIC Fabrication, etc.


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