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1: Physical Inspection
M1.A: Optical Probing Attack on Logic Locking
Training Time: 8 Hours
Difficulty: Advanced
Location: SCAN Lab
M1.B: Scanning Electron Microscope Training
Training Time: 8 Hours
Difficulty: Advanced
Location: SCAN Lab
M1.C: Hardware Trojan Detection in ICs Using SEM Images
Training Time: 8 Hours
Difficulty: Advanced
Location: SCAN Lab
M1.D: Counterfeit IC Detection Using Optical Imaging
Training Time: 8 Hours
Difficulty: Advanced
Location: SCAN Lab
M1.E: X-ray 3D Tomography Training
Training Time: 8 Hours
Difficulty: Advanced
Location: SCAN Lab
M1.F: Counterfeit PCB Detection Using Optical Imaging 1
Training Time: 4 Hours
Difficulty: Advanced
Location: SCAN Lab
M1.G: Counterfeit PCB Detection Using Optical Imaging 2
Training Time: 4 Hours
Difficulty: Advanced
Location: SCAN Lab
M1.H: Counterfeit PCB Detection Using X-ray Imaging
Training Time: 8 Hours
Difficulty: Advanced
Location: SCAN Labs
M1.I: THz Imaging and Spectroscopy for Package Security and Fingerprinting
Training Time: 8 Hours
Difficulty: Advanced
Location: SCAN Lab
M1.J: Probing-Aware Bitstream Generation with ShuFFle
Training Time: 8 Hours
Difficulty: Advanced
Location: SCAN Lab
2: Side Channel Signal Analysis
M2.A: Power Analysis Attacks on AES
Training Time: 4 Hours
Difficulty: Intermediate
Location: NEB 506 Lab
M2.B: Fault Injection Attacks on the AES Cipher
Training Time: 4 Hours
Difficulty: Intermediate to Advanced
Location: NEB 506 Lab
M2.C: Pre-silicon power side channel Assessment
Training Time: 4 Hours
Difficulty: Intermediate
Location: NEB 506 Lab
M2.D: EM SCA: Post-silicon
Training Time: 4 Hours
Difficulty: Intermediate
Location: NEB 506 Lab
3: Hardware Security Primitive
M3.A: Recycled FPGA Detection
Training Time: 4 Hours
Difficulty: Intermediate
Location: NEB 506 Lab
M3.B: Ring Oscillator based Physical Unclonable Functions (PUF)
Training Time: 4 Hours
Difficulty: Basic to Advanced
Location: NEB 506 Lab
M3.C: Ring Oscillator based True Random Number Generator (TRNG)
Training Time: 4 Hours
Difficulty: Intermediate
Location: NEB 506 Lab
M3.D: Recycled Chip Detection using CDIR odometer
Training Time: 4 Hours
Difficulty: Intermediate
Location: NEB 506 Lab
M3.E: VIA PUF (Silicon Measurement)
Training Time: 4 Hours
Difficulty: Intermediate
Location: NEB 506 Lab
4: Security Verification
M4.A: Hardware Trojan Insertion and Detection
Training Time: 4 Hours
Difficulty: Intermediate to Advanced
Location: NEB 506 Lab
M4.B: Basics of Verification
Training Time: 4 Hours
Difficulty: Intermediate to Advanced
Location: NEB 506 Lab
M4.C: Security Verification
Training Time: 4 Hours
Difficulty: Intermediate to Advanced
Location: NEB 506 Lab
5: IP Protection
M5.A: Logic locking Insertion and Assessment
Training Time: 4 Hours
Difficulty: Intermediate to Advanced
Location: NEB 506 Lab
6: SoC Design
M6.A: Development of System-on-chip (SoC) Architecture
Training Time: 4 Hours
Difficulty: Advanced
Location: NEB 506 Lab