Date(s) - 08/19/2020
12:00 - 13:00
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Dr. Jungmin Park, Assistant research scientist at the Florida Institute for Cybersecurity (FICS)
In this talk, Dr. Park will introduce how to analyze and quantify side-channel leakage information at various design stages such as RTL, gate level and post-silicon level. Based on these analysis, most vulnerable modules will be searched and replaced with secure modules.
Jungmin Park is an assistant research scientist at the Florida Institute for Cybersecurity (FICS). He received his B.S. degree and M.S. in electrical engineering from Kyunghee University, Korea, in 2007, and the M.S. in computer engineering from Kyunghee University, Korea, in 2009 and Ph.D. in computer engineering from Iowa State University, Ames, IA, in 2016. He joined the FICS research as a postdoctoral fellow in 2016.
Bookings are closed for this event.