Description
Certificates are available to members of MEST. To access the certificates, you must be logged in to your nanoHUB account, and a MEST group membership is required. The certificates have been specifically developed for US Citizens working in a DoD, Government, or Government-affiliated role. To gain access to the materials, please ensure you have a nanoHUB account registered with your organizational email and follow these steps:
1. Create a nanoHUB account at https://nanohub.org/register/.
2. Request membership in the MEST group at https://nanohub.org/groups/mest.
Security Primitives (PUF/TRNG)
M07 – Physical Unclonable Function (PUF) (Simulation)
M32 – Introduction to Physical Unclonable Functions
M34 – NIST Statistical Tests for PUFs
M35 – PUF Classes and Applications
M52 – RO PUF Implementation II
M53 – RO PUF Implementation III
M54 – RO PUF Implementation IV
M57 – RO based TRNG
SoC Verification
M46 – Intro to SoC – Basic SoC Arch
M48 – Formal Security Verification
M48 – Property based Security Verification
M51 – System level verification using SystemC-UVM
M55 – Basics of verification
W05 – Hardware Security Verification Using Formal Methods
W33 – Swatting the Hardware Security Bugs
SoC Design
M22 – Introduction to SoC Modeling with Platform
M46 – Intro to SoC – Basic SoC Arch
M47 – Intro to SoC – Interconn and Sys Integration
W13 – System Level Design of Secured System on Chips
W60 – Introduction to Systems-on-Chip: Concepts, Architecture, Challenges and Opportunities
Al/ML/LLM Introduction
Hardware Trojans
M04 – Hardware Trojan Insertion and Detection
M15 – Hardware Trojan Detection in ICs Using SEM Images
W11 – Computer Vision for HW Security
W21 – Closing Information Leakage Channels in Microarchitecture
Counterfeit Detection: Circuit based solution
M16 – Counterfeit IC detection using Optical Imaging
M18 – Counterfeit PCB Detection Using Optical Imaging I
M19 – Counterfeit PCB Detection Using Optical Imaging II
M20 – Counterfeit PCB Detection Using X-ray Imaging
Chip Imaging
M14 – Scanning Electron Microscope Training
M17 – X-ray 3D Tomography Training
M21 – Near-field Terahertz Imaging
Fault Injection Attacks
M49 – Detection of Fault Injection Attacks Using TDC Sensor
M56 – Fault Injection Attack on AES Chipher
M49 – Asynchronous Logic Circuit Design for Extreme Temperatures
Micro-architectural Attacks
M46 – Intro to SoC – Basic SoC Arch
M47 – Intro to SoC – Interconn and Sys Integration
M50 – Micro-architectural Attack Detection
W07 – Architecture Level Vulnerabilities
W21 – Closing Information Leakage Channels in Microarchitecture
W42 – Security Attacks and Defenses of the Micro-Op Cache and the Processor Frontend
Power Side Channel Attacks
IoT Security
M28 – Introduction to UAVs
M29 – Hardware Security of Drones
W09 – Security and Forensics in the IoT Era: From Reverse Engineering to HoteyIot
W55 – New Frontiers of Hardware Security in the IoT Regime
W58 – Firmware Frontiers: Tackling IoT Security from Bare-Metal to BusyBox
Physical Assurance
M14 – Scanning Electron Microscope Training
M16 – Counterfeit IC detection using Optical Imaging
M17 – X-ray 3D Tomography Training
M18 – Counterfeit PCB Detection Using Optical Imaging I
M21 – Near-field Terahertz Imaging
W04 – Physical Assurance and Inspection of Electronics
W56- Applying Physical Inspection for Achieving Microelectronics Assurance
Supply chain Security
M09 – Logic Locking Insertion and Assessment
M24 – Different Locking Schemes For Preventing IP Piracy I
W01 – The Art of Digital Design Using FPGAs
W03 – Introduction to Hardware Obfuscation
W08 – Blockchain for Electronics Supply Chain Integrity
W51 – Tracking and Tracing microchips: From wafer, to die to package