Description
Learning modules are available only to MEST members.
To access these modules, you must be logged in to your nanoHUB account, and a MEST group membership is required.
Target Audience: Designed for U.S. citizens working in the Department of War, Government, or Government-affiliated employees, industry, as well as college students and faculty. To gain access to the materials, please ensure you have a nanoHUB account registered with your organizational email and follow these steps:
1. Create a nanoHUB account at https://nanohub.org/register/.
2. Request membership in the MEST group at https://nanohub.org/groups/mest.
Your feedback matters! Help us gain a better understanding of your learning experience. We invite you to complete the short pre-module survey before you access any of the modules and the short post-module survey after completing the modules. Thank you.
PUF Design
M07 – Physical Unclonable Function (PUF) (Simulation)
M32 – Introduction to Physical Unclonable Functions
M34 – NIST Statistical Tests for PUFs
M35 – PUF Classes and Applications
M52 – RO PUF Implementation II
M53 – RO PUF Implementation III
M54 – RO PUF Implementation IV
M83 – PUF-Based Authentication: Introduction to Authentication
M84 – PUF-Based Authentication: Transport Layer Security
M85 – PUF-Based Authentication: Introduction to PUF-Based Authentication Protocols
M86 – PUF-Based Authentication: Overview of Fuzzy Extractors
M87 – PUF-Based Authentication: Recently Proposed PUF-based Authentication Protocols
TRNG Design
SoC Verification
SoC Design
AI/ML
UAV Systems
Logic Locking
M09 – Logic Locking Insertion and Assessment
M02 – Optical Probing Assessment on Logic Locking
M24 – Different Locking Schemes For Preventing IP Piracy I
M25 – Basics of Boolean Satisfiability Analysis
M26 – Boolean Satisfiability (SAT) Attack with tool demo on Logic Locking
M27 – SAT Attack Complexity Analysis
M70 – SAT Attack-based Simple Test Pattern Generation Approach
M71 – SAT Attack-based Complex Test Pattern Generation and Identification of Redundant Faults
Asynchronous Systems
M39 – Asynchronous Logic Circuit Design for Extreme Temperatures
M40 – Asynchronous Logic Circuit Design for Radiation Hardening
M41 – Asynchronous Logic Circuit Design for Side-Channel Attack Resilience
M80 – Asynchronous Polymorphic Circuits for Hardware Security – A Case Study
Hardware Trojan
Recycled IC Detection
Counterfeit Detection: imagei
IC Imaging
Fault Injection
eFPGA based runtime monitoring
Cryptographic Hardware
Hardware Emulation
IoT Hardware Security
LLM
LLM in SoC Security
M62 – Hardware Bug Detection using Large Language Model
M63 – Security Question-Answering Framework through Retrieval Augmented Generation
M99 – LLM-Driven Automatic Testbench Generation for RTL Security Bug Detection
M100 – Security Property and SystemVerilog Assertion Generation using LLM
M101 – Automated Threat Modeling and Test Plan Generation for Hardware Security
M103 – Hardware Asset Identification using Large Language Model

