Description
Learning modules are available to members of MEST. To access these modules, you must be logged in to your nanoHUB account, and a MEST group membership is required. These modules have been specifically developed for US Citizens working in a DoD, Government, or Government-affiliated role. To gain access to the materials, please ensure you have a nanoHUB account registered with your organizational email and follow these steps:
1. Create a nanoHUB account at https://nanohub.org/register/.
2. Request membership in the MEST group at https://nanohub.org/groups/mest.
PUF Design
M07 – Physical Unclonable Function (PUF) (Simulation)
M32 – Introduction to Physical Unclonable Functions
M34 – NIST Statistical Tests for PUFs
M35 – PUF Classes and Applications
M52 – RO PUF Implementation II
M53 – RO PUF Implementation III
TRNG Design
M57 – RO based TRNG
SoC Verification
M55 – Basics of verification
M48 – Property based Security Verification
M51 – System level verification using SystemC-UVM
SoC Design
M46 – Intro to SoC – Basic SoC Arch
M47 – Intro to SoC – Interconn and Sys Integration
M22 – Introduction to SoC Modeling with Platform
AI/ML
Secure UAV Design
Logic Locking
M09 – Logic Locking Insertion and Assessment
M02 – Optical Probing Assessment on Logic Locking
M24 – Different Locking Schemes For Preventing IP Piracy I
M25 – Different Locking Schemes for Preventing IP Piracy II
M26 – Boolean Satisfiability (SAT) Attack with tool demo on Logic Locking
Asynchronous Circuit Design
Hardware Trojan
M04 – Hardware Trojan Insertion and Detection
M15 – Hardware Trojan Detection in ICs Using SEM Images
Recycled IC Detection
M01 – Recycled FPGA Detection
M13 – Recycled Chip Detection Using RO-based Odometer
Counterfeit Detection: imagei
M16 – Counterfeit IC detection using Optical Imaging
M18 – Counterfeit PCB Detection Using Optical Imaging I
M19 – Counterfeit PCB Detection Using Optical Imaging II
M20 – Counterfeit PCB Detection Using X-ray Imaging
IC Imaging
M14 – Scanning Electron Microscope Training
M17 – X-ray 3D Tomography Training
M21 – Near-field Terahertz Imaging
Fault Injection
M56 – Fault Injection Attack on AES Chipher
M49 – Detection of Fault Injection Attacks Using TDC Sensor
Micro-architectural Attack
M50 – Cache-based Micro-architectural Attacks (Possible Issues)