Modules

Description

Learning modules are available to members of MEST only. To access these modules, you must be logged in to your nanoHUB account, and a MEST group membership is required. These modules have been specifically developed for US Citizens working in a DoD, Government, or Government-affiliated role. To gain access to the materials, please ensure you have a nanoHUB account registered with your organizational email and follow these steps:

1. Create a nanoHUB account at https://nanohub.org/register/.

2. Request membership in the MEST group at https://nanohub.org/groups/mest.

Your feedback matters! Help us gain a better understanding of your learning experience. We invite you to complete the short pre-module survey before you access any of the modules and the short post-module survey after completing the modules. Thank you.

Pre-module Survey

Post-module Survey

PUF Design

M07 – Physical Unclonable Function (PUF) (Simulation)

M32 – Introduction to Physical Unclonable Functions

M33 – PUF Statistics

M34 – NIST Statistical Tests for PUFs

M35 – PUF Classes and Applications

M36 – PUF Architectures I

M37 – RO PUF Implementation I

M52 – RO PUF Implementation II

M53 – RO PUF Implementation III

M54 – RO PUF Implementation IV

M58 – PUF Architectures II

M59 – PUF Architectures III

TRNG Design

M57 – RO based TRNG

SoC Verification

M55 – Basics of verification

M48 – Property based Security Verification

M51 – System level verification using SystemC-UVM

SoC Design

M46 – Intro to SoC – Basic SoC Arch

M47 – Intro to SoC – Interconn and Sys Integration

M22 – Introduction to SoC Modeling with Platform

AI/ML

M42 – Overview of Machine Learning

M43 – Domain Specific ML in Microelectronic Field

M44 – Introduction to Large Language Models (LLMs)

M45 – Introduction To IEA-Plot

Secure UAV Design

M28 – Introduction to UAVs

M29 – Hardware Security of Drones

M30 – UAV Cybersecurity

M31 – Digital Twin of UAV Hardware

Logic Locking

M09 – Logic Locking Insertion and Assessment

M02 – Optical Probing Assessment on Logic Locking

M24 – Different Locking Schemes For Preventing IP Piracy I

M25 – Basics of Boolean Satisfiability Analysis

M26 – Boolean Satisfiability (SAT) Attack with tool demo on Logic Locking

M27 – SAT Attack Complexity Analysis

Asynchronous Circuit Design

M38 – Overview of Asynchronous Logic Circuits and Their Applications in Microelectronics Security and Reliability

M39 – Asynchronous Logic Circuit Design for Extreme Temperatures

M40 – Asynchronous Logic Circuit Design for Radiation Hardening

M41 – Asynchronous Logic Circuit Design for Side-Channel Attack Resilience

Hardware Trojan

M04 – Hardware Trojan Insertion and Detection

M15 – Hardware Trojan Detection in ICs Using SEM Images

Recycled IC Detection

M01 – Recycled FPGA Detection

M13 – Recycled Chip Detection Using RO-based Odometer

Counterfeit Detection: imagei

M16 – Counterfeit IC detection using Optical Imaging

M18 – Counterfeit PCB Detection Using Optical Imaging I

M19 – Counterfeit PCB Detection Using Optical Imaging II

M20 – Counterfeit PCB Detection Using X-ray Imaging

IC Imaging

M14 – Scanning Electron Microscope Training

M17 – X-ray 3D Tomography Training

M21 – Near-field Terahertz Imaging

Fault Injection

M49 – Detection of Fault Injection Attacks Using TDC Sensor

M56 – Fault Injection Attack on AES Chipher

Micro-architectural Attack

M50 – Cache-based Micro-architectural Attacks (Possible Issues)