Applying Physical Inspection for Achieving Microelectronics Assurance

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Speaker:

Dr. Adam Kimura is a Senior Research Leader at Battelle Memorial Institute and has been working in the field of Trusted and Assured Microelectronics since 2013.

Abstract:

The semiconductor industry’s global supply chain has created the enormous challenge of providing authentic and trusted microelectronics devices – a concern for both industry and government alike.  One of the primary methods of addressing this problem is by applying physical inspection on the manufactured devices to validate their equivalence to the original trusted design in order to validate that the device will perform exactly as designed, not adding, removing, or altering any functionality.  This presentation will look at some of the foundational methods of physical inspection used for achieving post-silicon assurance in microelectronics.  It will cover the tools and processes that are used as well as discuss the challenges that remain for researchers to address.

Speaker Bio:

Dr. Adam Kimura is a Senior Research Leader at Battelle Memorial Institute and has been working in the field of Trusted and Assured Microelectronics since 2013.  He currently serves as the technical director for Battelle’s Cyber Trust and Analytics research and development portfolio and is the principal investigator for Battelle’s post-silicon verification and validation programs.  Dr. Kimura is an inventor on sixteen pending or issued patents and currently holds his B.S, M.S., and Ph.D. in Electrical & Computer Engineering from The Ohio State University.