Webinar: Counterfeit Detection: Electrical/Logical Test Techniques

To watch the recorded webinar, click on the recording.

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Speaker: 

Dr. Domenic Forte, Associate Professor and the Steven A. Yatauro Faculty Fellow in the Electrical and Computer Engineering (ECE) Department at the University of Florida

Abstract:

In this webinar, we will cover (i) Counterfeit electronic part sources and motivation; (ii) Counterfeit IC type, defect, and detection taxonomies; (iii) Basic parametric/functional tests; (iv) More advanced detection approaches that target counterfeit processors, memories, and FPGAs; (v) International standards and commercially available tools; and (vi) Open problems and future directions.

Speaker Bio:

I am currently an Associate Professor and the Steven A. Yatauro Faculty Fellow in the Electrical and Computer Engineering (ECE) Department at the University of Florida. Previously, I was an Assistant Professor in the Electrical and Computer Engineering (ECE) Department at the University of Connecticut. I received my PhD in Electrical and Computer Engineering from the University of Maryland in 2013. My current research focuses on:

1. Counterfeit Electronics Detection and Avoidance
2. Hardware Security Primitives
3. Hardware Trojan Detection and Prevention
4. Nanoscale Integration Challenges
5. Reverse Engineering and Anti-reverse Engineering
6. Computer-Aided Design (CAD) Tools, Metrics, and Rules for Hardware Security
7. Biometric Authentication

Past projects of mine include Dynamic Energy and Thermal management in Distributed Systems and Green Computing in Large-Scale Datacenters.