Date(s) - 08/18/2021
12:00 - 13:00
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Dr. Ujjwal Guin, Auburn University
The recycling of integrated circuits (ICs) has raised severe problems in ensuring the integrity of today’s globalized semiconductor supply chain and poses a serious threat to critical infrastructure due to potentially shorter lifetime, lower reliability, and inferior performance. This talk presents a series of resilient solutions to detect recycled ICs using a ring oscillator (RO), nonvolatile memory, radio-frequency identification (RFID) tag, and memory powerup states. A simple measurement device (e.g., a smartphone) can be used to authenticate a chip under test. These approaches can practically be applied to all the chip types that are either in the supply chain or already in production.
Ujjwal Guin is currently an Assistant Professor at the Department of Electrical and Computer Engineering, Auburn University. He received his Ph.D. degree from the University of Connecticut in 2016. He is actively involved in projects in the field of Hardware Security and Trust, Supply Chain Security, Cybersecurity, and VLSI Design and Test. He has developed several on-chip structures and techniques to improve the security, trustworthiness, and reliability of integrated circuits. His current research interests include Hardware Security & Trust, Blockchain, Supply Chain Security, Cybersecurity, and VLSI Design & Test. He is a co-author of the book “Counterfeit Integrated Circuits: Detection and Avoidance”. He has authored several journal articles and refereed conference papers. His projects are sponsored by the National Science Foundation (NSF), Air Force Research Laboratory (AFRL), and Auburn University.
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