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University of Florida (UF)

November 17, 2023 by Limor Herb
Phase 3, year 1 | Phase 3, year 2 | Phase 3, year 3 || Phase 3 year 4 |
Phase 3, year 1

Courses

Course IDCourseDeadlineReceived
C7Introduction to Advanced Packaging2/29/2024
C10Introduction to SoC Design1/16/2024
C11CAD for SoC Security1/31/2023

Modules

IDLab ModuleMain Tools/EquipmentPlatformDue DateReceived Date
M01Recycled FPGA DetectionXilinx Vivado Design SuiteSpartan-3A (90nm)  or Spartan-6 (45nm)11/30/20232/23/2024
M04Hardware Trojan Insertion and DetectionSynopsys Design Compiler, TetraMAX, and in-house scriptsN/A11/30/20232/23/2024
M07Physical Unclonable Function (PUF) (Simulation)Cadence Virtuoso Analog Design Environment and Layout Suite, Matlab, NIST databaseHSPICE11/30/20232/23/2024
M11Physical Unclonable Function (PUF) (measurement)Matlab, Tektronix TLA 7 Series, Agilent MA61 seriesXilinx 7 series FPGA (28nm)11/30/2023
M12Logic Obfuscation (measurement + imaging)Matlab, Tektronix TLA 7 Series, Agilent MA61 series + (Navid to add optical imaging)NA11/30/2023
M13CDIR Chip Odometer (measurement)Matlab, Tektronix TLA 7 Series, Agilent MA61 series, Digital Oscilloscope, Keysight X-Series Spectrum Analyzer, Heat chamberXilinx 7 series FPGA (28nm)11/30/20232/23/2024
M16Counterfeit IC Detection Using Optical ImagingDSLR Camera and Leica microscopeDIP, QFP, flip chip, etc. packaged chips11/30/20233/11/2024
M05FSM Fault Injection and CountermeasuresPHEMOS 1000Xilinx 7 series FPGA (28nm)12/15/2023
M08Power Side-Channel Analysis on AES (simulation)Cadence Virtuoso Analog Design Environment and Layout Suite, MatlabSynopsys12/15/2023
M18Counterfeit PCB Detection Using Optical Imaging 1DSLR Nikon camera+ Python and MATLABXilinx Sparta 61/15/20243/11/2024
M46Development of a Basic System-on-Chip Architecture in FPGA1/18/20243/29/2024
M47Introduction to SoC – System Integration and Interconnects1/29/20243/29/2024
M03Power/EM Analysis on AESMatlab,Tektronix TDS6604B, and Langer EMV RF-K 7-4 near-field probeMEST SoC          (22nm)1/30/2024
M09Logic Obfuscation (Simulation/layout)Cadence Virtuoso Analog Design Environment and Layout Suite, MatlabSynopsys1/30/20242/23/2024
M19Counterfeit PCB Detection Using Optical Imaging 2DSLR Nikon camera+Python and MATLABXilinx Sparta 61/30/20243/11/2024
M17X-ray 3D Tomography TrainingSkyscan 22114 layer customized PCB2/15/20243/11/2024
M22Modeling with Platform Architect2/20/20243/29/2024
M23Test and Verification of a System-on-chip (SoC) (Measurement)Summit 12000B Semi-Automated Probe- Station with Nanoprober/SEM, Tektronix Logic Analyzers and Oscilloscopes, PHEMOSMEST SoC          (22nm),2/28/2024
M48Property Based Security VerificationSynopsys VC Formal Cadence JasporGold EBC model checker Yosys and SAT solvers (e.g., minisat)2/28/20242/23/2024
M20Counterfeit PCB Detection Using X-ray ImagingSkyscan 2211Smartwatch board and Iotech board2/29/20243/11/2024
M14Scanning Electron Microscope TrainingTESCAN LYRA and FERAAMD Opteron 65 nm3/15/20243/11/2024
M21Near-field Terahertz ImagingProtemics THz imaging machineDIP, QFP, flip chip, etc. packaged chips3/15/20243/31/2024
M02Optical Probing Assessment on Logic LockingPHEMOS 1000iPROBE chip (65nm)3/30/20243/31/2024
M15Hardware Trojan Detection in ICs Using SEM ImagesTESCAN LYRA and FERA+AMD Opteron 65 nm and Smart Card 130 nm3/30/20243/11/2024
M06Mixed-Signal Side-Channel leakage (simulation)Cadence Virtuoso Analog Design Environment and Layout SuiteNA3/31/2024
M10Mixed-Signal Side-Channel leakage (measurement)Matlab, Tektronix TLA 7 Series, Agilent MA61 series, Digital Oscilloscope, Keysight X-Series Spectrum AnalyzerNA3/31/2024
M49Introduction to Time to digital convertor (TDC) sensor design3/31/20243/29/2024
M50Cache-based Micro-architectural Attacks3/31/20243/29/2024
M51SoC verification at high level using SystemC-UVM3/31/20243/29/2024
M55Basic Verification Methodology3/31/20243/29/2024
M56Fault Injection Attack on AES Chipher3/31/20243/29/2024
M57RO based TRNG3/31/20243/29/2024
Phase 3, year 2

Courses

Course IDCourseDeadlineReceived
C20CAD for Hardware Security Verification03/2025FF
C21Physical Attacks and Inspection of Electronics08/22/2024NA
C22Introduction to SoC Design01/20/2025CB

Modules

IDLab ModuleMain Tools/EquipmentPlatformDue DateReceived Date
M60Security Policy Definition and eFPGA Implementation for AES Denial-of-Service (DoS) and Information Leakage VulnerabilitiesMT01/15/202503/18/2025
M61Security Property Development and Fault-Injection SimulationMT01/15/202503/18/2025
M62Hardware Bug Detection with Large Language ModelMT01/15/202503/18/2025
M63Security Question Answering through Retrieval-Augmented GenerationMT01/15/202503/18/2025
M64Hardware Emulation based Fault Injection AssessmentFF01/15/202503/18/2025
M65Introduction to Hardware EmulationFF01/15/202503/18/2025
M66Resolution and TextureNA10/15/202410/15/2024
M67X-ray TomographyNA11/15/202411/26/2024
M68Introduction to PetaLinux – Embedded Operating SystemsCB10/15/202410/23/2024
M69Multi Processor IntegrationCB11/15/202412/10/2024
Phase 3, year 3

Modules

IDLab ModuleMain Tools/EquipmentPlatformDue DateReceived Date
M99LLM based testbench generation for bug detectionFF09/30/202509/30/2025
M100Security property generation using LLMFF10/22/202510/30/2025
M101Threat modeling and test plan generation using LLMFF10/22/202512/24/2025
M102Introduction to hardware runtime monitoringFF12/22/202510/30/2025
M103Security asset identification using LLMMT09/30/202509/30/2025
M104Introduction to Simulation Based FuzzingMT10/22/202511/03/2025
M105Introduction to Emulation-based FuzzingMT10/22/202501/06/2026
M106Best Practices for LLM-Generated HDLMT12/22/202501/08/2026
Phase 3, year 4

Modules

IDLab ModuleMain Tools/EquipmentPlatformDue DateReceived Date
M135Introduction to HDL LintingMT
M136EDA tool for HDL LintingMT
M137LLM based HDL LintingMT
M138RTL Code generation using LLMMT
M139Design modification using LLMMT
M140Design specification generation from RTL using LLMMT
M141Agentic Security Validation through Test GenerationFF
M142Agentic Automated RTL Debugging and Root CausingFF
M143Agentic Automated RTL Countermeasure DevelopmentFF
M142Agentic Linting Result Grouping and AssessmentFF
M145Agentic Concolic Testing with Security CoverageFF
M146Agentic based Equivalent Checking and Countermeasure DevelopmentsFF
M147LLM assisted runtime monitoring Design IFF
M148LLM assisted runtime monitoring Design IIFF
Category: Phase 3
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